Nanoscale Characterisation of Ferroelectric Materials, Physik & Astronomie

Nanoscale Characterisation of Ferroelectric Materials

Scanning Probe Microscopy Approach

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2004, 300 Seiten, Maße: 15,5 x 23,5 cm, Gebunden, Englisch

Springer-Verlag GmbH ISBN-10: 3540206620
ISBN-13: 9783540206620

Produkt-Beschreibung zu: Nanoscale Characterisation of Ferroelectric Materials

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

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Rezension zu: Nanoscale Characterisation of Ferroelectric Materials

From the reviews: "The aim of this book is to present recent advances in nanoscale characterization of electrical, mechanical and optical properties of ferroelectric materials made possible due to the use of the SPM techniques. ... will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. ... The book succeeds in being informative, balanced and intelligent ... . The references at the end of each chapter also make the book consistently informative and steadily rewarding." (Current Engineering Practice, Vol. 47 (3), 2004-2005)

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