Noncontact Atomic Force Microscopy, Fachbücher Technik

Noncontact Atomic Force Microscopy

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This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.

2013, XVIII, 401 Seiten, 77 farbige Abbildungen, 28 Schwarz-Weiß-Abbildungen, Maße: 23,5 cm, Kartoniert (TB), Englisch
Herausgegeben von Morita, Seizo; Giessibl, Franz J.; Wiesendanger, Roland

Springer Berlin ISBN-10: 3642260705
ISBN-13: 9783642260704

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Klappentext zu: Noncontact Atomic Force Microscopy

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.