Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics

(Sprache: Englisch)
 
 
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This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important....
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Bestellnummer: 23822415

Buch (Gebunden) 109.99
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