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Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization (Sprache: Englisch)
 
 
Merken
Merken
 
 
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials,...
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Bestellnummer: 137401675

Buch (Kartoniert) 219.99
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