Machine Learning Support for Fault Diagnosis of System-on-Chip

Introduction.- Prerequisites on Fault Diagnosis.- Conventional Methods for Fault Diagnosis.- Machine Learning and Its Applications in Test.- Machine Learning Support for Logic Diagnosis.- Machine Learning Support for Cell-Aware Diagnosis.- Machine Learning Support for Volume Diagnosis.- Machine Learning Support for Diagnosis of Analog Circuits.- Machine Learning Support for Board-level Functional Fault Diagnosis.- Machine Learning Support for Wafer-level Failure Cluster Identification.- Conclusion.

Patrick GIRARD received a M.Sc. degree in Electrical Engineering and a Ph.D. degree in Microelectronics from the University of Montpellier, France, in 1988 and 1992 respectively. He also received the "Habilitation à Diriger des Recherches" degree from the University of Montpellier, France, in 2003. He is currently Research Director at CNRS (French National Center for Scientific Research) and works in the Microelectronics Department of the Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM) - France.Patrick Girard is Coordinator of the International Research Project « INSIMIA » (French-Italian Research Program on the Integrity of Integrated Systems in the Era of Artificial Intelligence) created in 2021 by the CNRS and the University of Montpellier, France, with the Politecnico di Torino, Italy. Since 2006, he is deputy director of the French scientific network dedicated to research in the fields of System-on-Chip, Embedded Systems and Connected Objects(SOC2), a network composed of 1400 researchers. From 2010 to 2014, he was Director of the Microelectronics Department at LIRMM, at that time composed of about 100 people. His research interests include all aspects of digital and memory circuit test and reliability, with emphasis on critical constraints such as timing and power. Robust design of neuromorphic circuits, test of approximate circuits, as well as machine learning for fault diagnosis are also part of his new research activities.

Patrick Girard is Technical Activities Chair of the Test Technology Technical Council (TTTC) of the IEEE Computer Society. From 2006 to 2010, he was Vice-Chair of the European TTTC (ETTTC) of the IEEE Computer Society. He has served on numerous conference committees including ACM/IEEE Design Automation Conference (DAC), ACM/IEEE Design Automation and Test in Europe (DATE), IEEE International Test Conference (ITC), IEEE VLSI Test Symposium (VTS), IEEE European Test Symposium (ETS), IEEE Asian Test