Nanotribology and Nanomechanics I

Introduction - Measurement Techniques and Applications.- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes.- General and Special Probes in Scanning Microscopies.- Force Calibration Techniques for AFM Cantilevers.- Noncontact Atomic Force Microscopy and Related Topics.- Low Temperature Scanning Probe Microscopy.- Dynamic Modes of Atomic Force Microscopy.- Molecular Single Molecular Recognition Force Spectroscopy and Imaging.- Nanomechanical Properties of Solid Surfaces and Thin Films.- Computer Simulations of Nanometer-Scale Indentation and Friction.

Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.