Quantum Metrology, Imaging, and Communication
(Sprache: Englisch)
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and...
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Klappentext zu „Quantum Metrology, Imaging, and Communication “
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Inhaltsverzeichnis zu „Quantum Metrology, Imaging, and Communication “
Quantum Optics and Entanglement.- Two-Photon Interference- Aberration and Dispersion Cancelation.- Quantum Metrology.- Polarization Mode Dispersion.- Ghost Imaging and Related Topics.- Quantum Microscopy.- Correlated and Entangled Orbital Angular Momentum.- Quantum Communication and Cryptography.- Appendices A: Review of Optics.- B: Optical Fields in Quantum Mechanics.- C: Optical Effects of Aberration and Turbulence.- D: Phase Matching in Spontaneous Parametric Down Conversion.- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.
Autoren-Porträt von David S. Simon, Gregg Jaeger, Alexander V. Sergienko
David Simon. Professor, Stonehill College, Easton MA 02357, USA Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA
Alexander V. Sergienko, Boston University, Boston MA 02215, USA
Bibliographische Angaben
- Autoren: David S. Simon , Gregg Jaeger , Alexander V. Sergienko
- 2018, Softcover reprint of the original 1st ed. 2017, XII, 273 Seiten, 68 farbige Abbildungen, Maße: 15,6 x 23,5 cm, Kartoniert (TB), Englisch
- Verlag: Springer, Berlin
- ISBN-10: 3319835408
- ISBN-13: 9783319835402
Sprache:
Englisch
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