Scanning Probe Microscopy
Electrical and Electromechanical Phenomena at the Nanoscale
(Sprache: Englisch)
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical...
Leider schon ausverkauft
versandkostenfrei
Buch
417.99 €
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenlose Rücksendung
- Ratenzahlung möglich
Produktdetails
Produktinformationen zu „Scanning Probe Microscopy “
Klappentext zu „Scanning Probe Microscopy “
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Inhaltsverzeichnis zu „Scanning Probe Microscopy “
SPM Techniques for electrical characterization.- Scanning Tunneling Microscopy and Tunneling Potentiometry.- Scanning Spreading Resistance Microscopy and Scanning Potentiometry.- Scanning Capacitance Microscopy and Nanoimpedance Microscopy.- Scanning Gate Microscopy.- Force-based SPM transport measurements: KPFM, EFM and SIM.- Piezoresponse Force Microscopy.- Ultrasonic Force Microscopy.- Microwave Microscopy.- Near Field Optical Microscopy.- Electrochemical STM.- Advanced SPM Probes for Electrical Characterization.- Electrical and electromechanical imaging at the limits of resolution.- Surface Metal Insulator Transitions.- Spin polarized STM.- STM probing of molecular transport.- Kelvin Probe Force Microscopy of atomic systems.- Single-electron transport in 1D systems.- Theoretical aspects of electrical transport imaging in molecular systems
Bibliographische Angaben
- Autoren: Sergei V. Kalinin , Alexei Gruverman
- 2006, 2007., 980 Seiten, mit farbigen Abbildungen, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Verlag: Springer, New York
- ISBN-10: 0387286675
- ISBN-13: 9780387286679
- Erscheinungsdatum: 18.12.2006
Sprache:
Englisch
Rezension zu „Scanning Probe Microscopy “
From the reviews:
Kommentar zu "Scanning Probe Microscopy"
Schreiben Sie einen Kommentar zu "Scanning Probe Microscopy".
Kommentar verfassen