VLSI Design and Test
22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
(Sprache: Englisch)
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully...
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully...
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Klappentext zu „VLSI Design and Test “
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Inhaltsverzeichnis zu „VLSI Design and Test “
Digital design.- Analog and mixed signal design.- Hardware security.- Micro bio-fluidics.- VLSI testing.- Analog circuits and devices.- Network-on-chip.- Memory.- Quantum computing and NoC.- Sensors and interfaces.
Bibliographische Angaben
- 2019, 1st ed. 2019, XVIII, 722 Seiten, 324 farbige Abbildungen, Maße: 15,5 x 23,5 cm, Kartoniert (TB), Englisch
- Herausgegeben: S. Rajaram, N. B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh
- Verlag: Springer, Berlin
- ISBN-10: 9811359490
- ISBN-13: 9789811359491
- Erscheinungsdatum: 25.01.2019
Sprache:
Englisch
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