Atomic Force Microscopy in Liquid (ePub)

PART I: General Atomic Force Microscopy AFM: BASIC CONCEPTS Atomic Force Microscope: Principles Piezoelectric Scanners Tips and Cantilevers Force Detection Methods for Imaging in Liquids AFM Operation Modes: Contact, Jumping/Pulsed, Dynamic The Feedback Loop Image Representation Artifacts and Resolution Limits CARBON NANOTUBE TIPS IN ATOMIC FORCE MICROSCOPY WITH APPLICATIONS TO IMAGING IN LIQUID Introduction Fabrication of CNT AFM Probes Chemical Functionalization Mechanical Properties of CNTs in Relation to AFM Applications Dynamics of CNT Tips in Liquid Performance and Resolution of CNT Tips in Liquid FORCE SPECTROSCOPY Introduction Measurement of Force Curves Measuring Surface Forces by the Surface Force Apparatus Forces between Macroscopic Bodies Theory of DLVO Forces between Two Surfaces Van der Waals Forces ?the Hamaker Constant Electrostatic Force between Surfaces in a Liquid Spatially Resolved Force Spectroscopy Force Spectroscopy Imaging of Single DNA Molecules Solvation Forces Hydrophobic Forces Steric Forces Conclusive Remarks DYNAMIC-MODE AFM IN LIQUID Introduction Operation Principles Instrumentation Quantitative Force Measurements High-Resolution Imaging Summary and Future Prospects FUNDAMENTALS OF AFM CANTILEVER DYNAMICS IN LIQUID ENVIRONMENTS Introduction Review of Fundamentals of Cantilever Oscillation Hydrodynamics of Cantilevers in Liquids Methods of Dynamic Excitation Dynamics of Cantilevers Interacting with Samples in Liquids Outlook SINGLE-MOLECULE FORCE SPECTROSCOPY Introduction AFM-SMFS Principles Dynamics of Adhesion Bonds Specific versus Other Interactions Steered Molecular Dynamics Simulations Biological Findings Using AFM?SMFS Concluding Remarks HIGH-SPEED AFM FOR OBSERVING DYNAMIC PROCESSES IN LIQUID Introduction Theoretical Derivation of Imaging Rate and Feedback Bandwidth Techniques Realizing High-Speed Bio-AFM Substrate Surfaces Imaging of Dynamic Molecular Processes Future Prospects of High-Speed AFM Conclusion INTEGRATION OF AFM

Arturo M Baró has spent most of his career at the Universidad Autonoma of Madrid and has been working in the fi eld of Surface Physics and Nanoscience. In 1983, he spent one year at the IBM Research Lab in Zürich where he worked with Professors Rohrer and Binnig, who
discovered STM. He is the author of 160 publications with a citation index h = 38. In 1985, he founded the company NANOTEC ELECTRONICA, S.L., which is dedicated to the fabrication and sale of AFM machines. He has been honored with the research prizes from the Humboldt
Foundation.

Ronald G. Reifenberger has been on the faculty at Purdue University, W. Lafayette, USA since 1978. Following his PhD in physics from the University of Chicago, he was a post-doctoral fellow at the University of Toronto, Canada. His nanophysics laboratory at Purdue uses
innovative experimental techniques to examine nanoscale properties of matter. His research focus since 1985 has been primarily scanning probe microscopy. Reifenberger is currently the director of the Kevin G. Hall Nanometrology Laboratory in the Birck Nanotechnology Center
at Purdue.

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