ESD (PDF)
Physics and Devices
(Sprache: Englisch)
This volume is the first in a series of three books addressing
Electrostatic Discharge (ESD) physics, devices, circuits and design
across the full range of integrated circuit technologies. ESD
Physics and Devices provides a concise treatment of the...
Electrostatic Discharge (ESD) physics, devices, circuits and design
across the full range of integrated circuit technologies. ESD
Physics and Devices provides a concise treatment of the...
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This volume is the first in a series of three books addressing
Electrostatic Discharge (ESD) physics, devices, circuits and design
across the full range of integrated circuit technologies. ESD
Physics and Devices provides a concise treatment of the ESD
phenomenon and the physics of devices operating under ESD
conditions. Voldman presents an accessible introduction to the
field for engineers and researchers requiring a solid grounding in
this important area. The book contains advanced CMOS, Silicon On
Insulator, Silicon Germanium, and Silicon Germanium Carbon. In
addition it also addresses ESD in advanced CMOS with discussions on
shallow trench isolation (STI), Copper and Low K materials.
* Provides a clear understanding of ESD device physics and the
fundamentals of ESD phenomena.
* Analyses the behaviour of semiconductor devices under ESD
conditions.
* Addresses the growing awareness of the problems resulting from
ESD phenomena in advanced integrated circuits.
* Covers ESD testing, failure criteria and scaling theory for
CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon
Germanium) technologies for the first time.
* Discusses the design and development implications of ESD in
semiconductor technologies.
An invaluable reference for EMC non-specialist engineers and
researchers working in the fields of IC and transistor design.
Also, suitable for researchers and advanced students in the fields
of device/circuit modelling and semiconductor reliability.
Electrostatic Discharge (ESD) physics, devices, circuits and design
across the full range of integrated circuit technologies. ESD
Physics and Devices provides a concise treatment of the ESD
phenomenon and the physics of devices operating under ESD
conditions. Voldman presents an accessible introduction to the
field for engineers and researchers requiring a solid grounding in
this important area. The book contains advanced CMOS, Silicon On
Insulator, Silicon Germanium, and Silicon Germanium Carbon. In
addition it also addresses ESD in advanced CMOS with discussions on
shallow trench isolation (STI), Copper and Low K materials.
* Provides a clear understanding of ESD device physics and the
fundamentals of ESD phenomena.
* Analyses the behaviour of semiconductor devices under ESD
conditions.
* Addresses the growing awareness of the problems resulting from
ESD phenomena in advanced integrated circuits.
* Covers ESD testing, failure criteria and scaling theory for
CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon
Germanium) technologies for the first time.
* Discusses the design and development implications of ESD in
semiconductor technologies.
An invaluable reference for EMC non-specialist engineers and
researchers working in the fields of IC and transistor design.
Also, suitable for researchers and advanced students in the fields
of device/circuit modelling and semiconductor reliability.
Autoren-Porträt von Steven H. Voldman
Dr Steven H. Voldman received his B.S. in Engineering Science from the University of Buffalo (1979); M.S. EE (1981) and Electrical Engineer Degree (1982) from M.I.T; MS Engineering Physics (1986) and Ph.D EE (1991) from the University of Vermont under IBM's Resident Study Fellow Program. At M.I.T, he worked as a member of the M.I.T. Plasma Fusion Center, and the High Voltage Research Laboratory (HVRL). At IBM, as a reliability device engineer, his work include pioneering work in bipolar/ CMOS SRAM alpha particle and cosmic ray SER simulation, MOSFET gate-induced drain leakage (GIDL) mechanism, hot electron, epitaxy/well design, CMOS latchup, and ESD. Since 1986, he has been responsible for defining the IBM ESD/latchup strategy for CMOS, SOI, BiCMOS and RF CMOS and SiGe technologies. He has authored ESD and latchup publications in the area of MOSFET Scaling, device simulations, copper, low-k, MR heads, CMOS, SOI , Sage and SiGeC technology. Voldman served as SEMATECH ESD Working Group Chairman (1996-2000), ESD Association General Chairman and Board of Directors, International Reliability Physics (IRPS) ESD/Latchup Chairman, International Physical and Failure Analysis (IPFA) Symposium ESD Sub-Committee Chairman, ESD Association Standard Development Chairman on Transmission Line Pulse Testing, ESD Education Committee, and serves on the ISQED Committee, Taiwan ED Conference (T-ESDC) Technical Program Committee. Voldman has provided ESD lectures for universities (e.g. MIT Lecture Series, Taiwan National Chiao-Tung University, and Singapore Nanyang Technical University). He is a recipient of over 125 US patents, over 100 publications, and also provides talks on patenting, and invention. He has been featured in EE Times, Intellectual Property Law and Business and authored the first article on ESD phenomena for the October 2002 edition of Scientific American entitled Lightening Rods for Nanostructures, and Pour La Science, Le Scienze, and Swiat Nauk international editions.
... mehr
Dr. Voldman was recently accepted as the first IEEE Fellow for ESD phenomena in semiconductors for ' contributions to electrostatic discharge protection CMOS, SOI and SiGe technologies'.
... weniger
Bibliographische Angaben
- Autor: Steven H. Voldman
- 2005, 420 Seiten, Englisch
- Verlag: John Wiley & Sons
- ISBN-10: 0470012900
- ISBN-13: 9780470012901
- Erscheinungsdatum: 13.12.2005
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