Fault-Tolerance Techniques for SRAM-Based FPGAs / Frontiers in Electronic Testing Bd.32 (PDF)

Name: Fault-Tolerance Techniques for SRAM-Based FPGAs / Frontiers in Electronic Testing Bd.32
Brand: Springer-Verlag GmbH
SKU: 29548699
Price: 98.99 EUR
Availability: OnlineOnly

(Sprache: Englisch)

Autoren: Fernanda Lima Kastensmidt , Ricardo Reis

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Fault-Tolerance Techniques for SRAM-Based FPGAs / Frontiers in Electronic Testing Bd.32, Fernanda Lima Kastensmidt, Ricardo Reis

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This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications.

Inhaltsverzeichnis zu „Fault-Tolerance Techniques for SRAM-Based FPGAs / Frontiers in Electronic Testing Bd.32 (PDF)“

Dedication. Authors. Preface. 1.Introduction. 2.Radiation effects in integrated circuits. 3.Single event upset (seu) mitigation techniques. 4.Architectural seu mitigation techniques. 5.High-level seu mitigation techniques. 6.Triple modular redundancy (tmr) robustness. 7.Designing and testing a tmr micro-controller. 8.Reducing TMR overheads: Part I. 9.Reducing TMR overheads: Part II. 10.Final remarks. References.