Radiation Effects in Semiconductors (ePub)

Name: Radiation Effects in Semiconductors
Brand: Taylor & Francis
SKU: 109701867
Price: 270.40 EUR
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(Sprache: Englisch)

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Semiconductor devices and circuits are prone to potential radiation damage problems, which must be understood and combated. Written by international experts, this book explains the effects of radiation on semiconductor devices, radiation detectors, and electronic devices and components. The contributors explore emerging applications, detector technologies, circuit design techniques, new materials, and innovative system approaches. The text focuses on how the technology is being used rather than the mathematical foundations behind it. It covers CMOS radiation-tolerant circuit implementations, CMOS processing causing radiation damage, and radiation detectors, among other topics.

Autoren-Porträt

Krzysztof (Kris) Iniewski is managing R&D chip development activities at Redlen Technologies Inc., a start-up company in British Columbia. His research interests are in VLSI circuits for medical and security applications. From 2004 to 2006 he was an Associate Professor at the Electrical Engineering and Computer Engineering Department of University of Alberta where he conducted research on low-power wireless circuits and systems. During his tenure in Edmonton he wrote "Wireless Technologies: Circuits, Systems and Devices" (CRC Press). From 1995 to 2003, he was with PMC-Sierra and held various technical and management positions. Prior to joining PMC-Sierra, from 1990 to 1994 he was an Assistant Professor at the University of Toronto's Electrical Engineering and Computer Engineering. Dr. Iniewski has published more than 100 research papers in international journals and conferences. He holds 18 international patents granted in USA, Canada, France, Germany, and Japan. He received his Ph.D. degree in electronics (honors) from the Warsaw University of Technology (Warsaw, Poland) in 1988.

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Bibliographische Angaben

2018, 1. Auflage, 431 Seiten, Englisch
Herausgegeben: Krzysztof Iniewski
Verlag: Taylor & Francis
ISBN-10: 1351833758
ISBN-13: 9781351833752
Erscheinungsdatum: 03.09.2018

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Dateiformat: ePub
Größe: 14 MB
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