Scanning Probe Microscopy in Nanoscience and Nanotechnology / NanoScience and Technology (PDF)
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy...
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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
- 2010, 2010, 956 Seiten, Englisch
- Herausgegeben: Bharat Bhushan
- Verlag: Springer-Verlag GmbH
- ISBN-10: 3642035353
- ISBN-13: 9783642035357
- Erscheinungsdatum: 22.01.2010
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
- Dateiformat: PDF
- Größe: 28 MB
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