Structural Analysis of Point Defects in Solids / Springer Series in Solid-State Sciences Bd.43 (PDF)
An Introduction to Multiple Magnetic Resonance Spectroscopy
(Sprache: Englisch)
Strutural Analysis of Point Defects in Solids introduces the
principles and techniques of modern electron paramagnetic
resonance (EPR) spectroscopy essentialfor applications to
the determination of microscopic defect
structures. Investigations...
principles and techniques of modern electron paramagnetic
resonance (EPR) spectroscopy essentialfor applications to
the determination of microscopic defect
structures. Investigations...
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Strutural Analysis of Point Defects in Solids introduces the
principles and techniques of modern electron paramagnetic
resonance (EPR) spectroscopy essentialfor applications to
the determination of microscopic defect
structures. Investigations of the microscopic and electronic
structure, and also correlations with the
magnetic propertiesof solids, require various multiple
magnetic resonance methods, such as ENDOR and optically
detected EPR or ENDOR. This book discusses experimental,
technological and theoretical aspects of these techniques
comprehensively, from a practical viewpoint, with many
illustrative examples taken from semiconductors and other
solids. The nonspecialist is informed about the potential of
the different methods, while the researcher faced with the
task of determining defect structures isprovided with the
necessary tools, together with much information on
computer-aided methods of data analysis and the principles
of modern spectrometer design.
principles and techniques of modern electron paramagnetic
resonance (EPR) spectroscopy essentialfor applications to
the determination of microscopic defect
structures. Investigations of the microscopic and electronic
structure, and also correlations with the
magnetic propertiesof solids, require various multiple
magnetic resonance methods, such as ENDOR and optically
detected EPR or ENDOR. This book discusses experimental,
technological and theoretical aspects of these techniques
comprehensively, from a practical viewpoint, with many
illustrative examples taken from semiconductors and other
solids. The nonspecialist is informed about the potential of
the different methods, while the researcher faced with the
task of determining defect structures isprovided with the
necessary tools, together with much information on
computer-aided methods of data analysis and the principles
of modern spectrometer design.
Bibliographische Angaben
- Autoren: Johann-Martin Spaeth , Jürgen R. Niklas , Ralph H. Bartram
- 2012, 1992, 367 Seiten, Englisch
- Verlag: Springer Berlin Heidelberg
- ISBN-10: 3642844057
- ISBN-13: 9783642844058
- Erscheinungsdatum: 06.12.2012
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
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- Größe: 30 MB
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Sprache:
Englisch
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