Mixed-Signal Layout Generation Concepts / The Springer International Series in Engineering and Computer Science Bd.751 (PDF)
This title covers important physical-design issues that exist in contemporary analogue and mixed-signal design flows. The authors bring together many principles and techniques required to successfully develop and implement layout generation tools to...
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This title covers important physical-design issues that exist in contemporary analogue and mixed-signal design flows. The authors bring together many principles and techniques required to successfully develop and implement layout generation tools to accommodate many mixed-signal layout generation needs.
- Autoren: Chieh Lin , Arthur H. M. van Roermund , Domine Leenaerts
- 2005, 2003, 210 Seiten, Englisch
- Verlag: Springer-Verlag GmbH
- ISBN-10: 030648725X
- ISBN-13: 9780306487255
- Erscheinungsdatum: 15.12.2005
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
- Dateiformat: PDF
- Größe: 14 MB
- Ohne Kopierschutz
- Vorlesefunktion
From the reviews:
"This book covers high-level placement and routing methods available from the 1970s to the present. For readers who want to learn about available layout algorithms, this book is a must. … Readers will gain insight into what is challenging about routing and how to measure routing quality. … This book is suitable for readers who want to learn about layout algorithms … ." (IEEE Circuits & Devices Magazine, Vol. 21 (4), July/August, 2005)
"Mixed-Signal Layout Generation Concepts is an outstanding text that provides a clear insight on how to efficiently solve the tasks of placement and routing … . The book is timely and well structured. … The quality of all the contributions … is generally high. This book should be of considerable interest for graduate-level students in Electrical Engineering. … It can be also a worthwhile purchase for anyone interested in … VLSI design. I heartily recommend the book to anyone interested in system-on-a-chip design." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)
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