Applied Scanning Probe Methods II.Vol.2
Scanning Probe Microscopy Techniques
(Sprache: Englisch)
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling...
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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Klappentext zu „Applied Scanning Probe Methods II.Vol.2 “
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Inhaltsverzeichnis zu „Applied Scanning Probe Methods II.Vol.2 “
- Robert W. Stark and Martin Stark: Higher Harmonics in Dynamic Atomic Force Microscopy- Ute Rabe: Atomic Force Acoustic Microscopy
- Tilman E. Schäffer, Boris Anczykowski, Harald Fuchs: Scanning Ion Conductance Microscopy
- Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner: Spin-polarized Scanning Tunneling Microscopy
- Ferry Kienberger, Hermann Gruber, and Peter Hinterdorfer: Dynamic Force Microscopy and Spectroscopy
- Egbert Oesterschulze, Leon Abelmann, Arnout van den Bos, Rainer Kassing, Nicole Schwendler, Gunther Wittstock, and Christiane Ziegler: Sensor Technology for SPM and new Applications
- Malgorzata Lekka and Andrzej J. Kulik: Quantitative Nanomechanical Measurements in Biology
- Pascal Vairac and Bernard Cretin: Scanning Microdeformation Microscopy : Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale
- P. Girard and A.N. Titkov: Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interests and Applications for Characterisations of Semiconductor Materials and Devices
- Pietro Giuseppe Gucciardi, Ruggero Micheletto, Yoichi Kawakami, and Maria Allegrini: Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures
- Vittoria Raffa, Piero Castrataro, Arianna Menciassi, and Paolo Dario: Focused Ion Beam as a Scanning Probe: Methods and Applications.
Autoren-Porträt
Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.
Bibliographische Angaben
- 2006, XLIII, 420 Seiten, Maße: 16,5 x 24,7 cm, Gebunden, Englisch
- Herausgegeben: Bharat Bhushan, Harald Fuchs
- Verlag: Springer, Berlin
- ISBN-10: 3540262423
- ISBN-13: 9783540262428
- Erscheinungsdatum: 21.02.2006
Sprache:
Englisch
Rezension zu „Applied Scanning Probe Methods II.Vol.2 “
From the reviews:"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. ... As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)
Pressezitat
From the reviews: "The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. ... As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)
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