Circuit Design for Reliability
(Sprache: Englisch)
Describing practical modeling and characterization techniques for designing reliable electrical circuits, this volume includes a thorough presentation of robust designs for major VLSI units. Its first-principle simulations aid physical understanding.
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Describing practical modeling and characterization techniques for designing reliable electrical circuits, this volume includes a thorough presentation of robust designs for major VLSI units. Its first-principle simulations aid physical understanding.
Klappentext zu „Circuit Design for Reliability “
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
Inhaltsverzeichnis zu „Circuit Design for Reliability “
Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.
Bibliographische Angaben
- 2015, 2015, VI, 272 Seiten, 132 farbige Abbildungen, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Herausgegeben: Ricardo Reis, Yu Cao, Gilson Wirth
- Verlag: Springer, Berlin
- ISBN-10: 1461440777
- ISBN-13: 9781461440772
- Erscheinungsdatum: 08.11.2014
Sprache:
Englisch
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