Using Imperfect Semiconductor Systems for Unique Identification
(Sprache: Englisch)
This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question....
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This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques.Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.
Inhaltsverzeichnis zu „Using Imperfect Semiconductor Systems for Unique Identification “
An Introduction to Security Based on Physical Disorder.- An Introduction to Semiconductors and Quantum Confinement.- Sample Preparation and Experimental Techniques.- Unique Identification with Resonant Tunneling Diodes.- Langmuir-Blodgett Deposition of 2D Materials for Unique Identification.- Building Optoelectronic Heterostructures with the Langmuir-Blodgett Technique.- Conclusions and Future Work.Bibliographische Angaben
- Autor: Jonathan Roberts
- 2017, 1st ed. 2017, XV, 123 Seiten, 8 farbige Abbildungen, Maße: 15,9 x 24,4 cm, Gebunden, Englisch
- Verlag: Springer, Berlin
- ISBN-10: 3319678906
- ISBN-13: 9783319678900
- Erscheinungsdatum: 22.09.2017
Sprache:
Englisch
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