VLSI Design and Test
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
(Sprache: Englisch)
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss...
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Klappentext zu „VLSI Design and Test “
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Inhaltsverzeichnis zu „VLSI Design and Test “
VLSI design.- Testing and verification.- Embedded systems.- Emerging technology.
Bibliographische Angaben
- 2013, 2013, XVI, 388 Seiten, Maße: 16,4 x 23,9 cm, Kartoniert (TB), Englisch
- Herausgegeben: Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh
- Verlag: Springer, Berlin
- ISBN-10: 3642420230
- ISBN-13: 9783642420238
Sprache:
Englisch
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