X-Ray Spectroscopy for Chemical State Analysis
(Sprache: Englisch)
This book focuses on X-ray spectroscopy for chemical state analysis covering X-ray physics, spectroscopic characteristics used for functional and toxic materials, and the author's ideas related to X-ray experiments. This book also provides novel theoretical...
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This book focuses on X-ray spectroscopy for chemical state analysis covering X-ray physics, spectroscopic characteristics used for functional and toxic materials, and the author's ideas related to X-ray experiments. This book also provides novel theoretical interpretations of X-ray spectra along with experimental techniques needed for both synchrotron radiation users and laboratory experimentalists. Presenting not only practical information, this book also covers basic knowledge of commercially available spectrometers and the basic physics of optics and electromagnetism related to X-rays. Furthermore, the author introduces the forgotten history of X-ray physics in the beginning of twentieth century. This book is of use for researchers studying catalysts, charge-transfer materials, surface characterization, and toxic trace elements via X-ray spectroscopy for chemical state analysis as well as quantitative analysis.Inhaltsverzeichnis zu „X-Ray Spectroscopy for Chemical State Analysis “
Chapter 1 Particle and wave duality of X-rays.- Chapter 2 Profile change of X-ray spectra.- Chapter 3 Chemical effects of multiply ionized satellites.- Chapter 4 Pyroelectric X-ray emission.- Chapter 5 Small size and low power X-ray instruments.- Chapter 6 Synchrotron radiation experiments.- Chapter 7 Quantitative analysis using XRF and SEM.- Chapter 8 Conclusions.Autoren-Porträt von Jun Kawai
Jun Kawai studies X-ray physics and chemistry, since 1981, when he joined Prof. Gohshi's laboratory, the University of Tokyo, in order to study the chemical effects of X-ray emission spectra, then moved to Institute for Molecular Science for the theoretical studies of the solid state effects of X-ray spectra, then moved to the Institute of Industrial Science, the University of Tokyo, for the development of X-ray photoelectron diffraction, then moved to RIKEN (The Institute of Physical and Chemical Research) as postdoctoral fellow for studying the total reflection X-ray photoelectron spectroscopy (XPS) as well as particle-induced X-ray emission (PIXE), and then moved to Kyoto University, where he studies radiative Auger effect, X-ray fluorescence holography, blackbody radiation, pyroelectric X-ray generation, polarization of Compton scattering, and so on. He teaches "Quantum Spectrochemistry" in Kyoto University, and the present book is partly based on this lecture. He has beenan associate editor of a journal "X-Ray Spectrometry" from Wiley and was a member of the editorial advisory board of "Spectrochimica Acta Part B: Atomic Spectroscopy" from Elsevier for more than 20 years.
Bibliographische Angaben
- Autor: Jun Kawai
- 2022, 1st ed. 2023, IX, 234 Seiten, 43 farbige Abbildungen, Maße: 15,5 x 23,5 cm, Gebunden, Englisch
- Verlag: Springer, Berlin
- ISBN-10: 9811973601
- ISBN-13: 9789811973604
Sprache:
Englisch
Pressezitat
"The book written by Professor Jun Kawai allows us to refresh, learn or relearn many of those subtle concepts that often go unnoticed. This academic fact in X-ray spectroscopy together with Professor Kawai's personal experiences throughout his long career make the book a worthy candidate for inclusion in our XRS Knowledge Area Library." (Ramón Fernández Ruiz , Spectrochimica Acta Part B, Atomic Spectroscopy, Vol. 203, 2023)"Professor Jun Kawai (Kyoto University, Japan) has published an interesting and useful book on materials characterization methods using X-ray emission, absorption, and photoelectron spectroscopies. Readers will be able to learn about basic X-ray physics topics ... . Overall, this book seems to provide a good overview of X-ray spectroscopy methods and their applications. The inclusion of historical context and the author's experiences helps to give readers insightinto how these techniques were developed and applied in practice." (Kenji Sakurai, X-RAY Spectrometry, Vol. 52 (4), 2023)
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