System Dependability and Analytics / Springer Series in Reliability Engineering (PDF)
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This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, and technologies. Reading this book, researchers, professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics.
The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008-2011. The book contains chapters written by many of his former students.
Arjun P. Athreya is Assistant Professor in the Dept. Of Molecular Pharmacology and Experimental Therapeutics, College of Medicine, Mayo Clinic, Rochester, MN, USA. Saurabh Bagchi is Professor at Purdue University and International Visiting Faculty at the Indian Institute of Technology at Kharagpur. He is the founding Director of the CRISP Research Center at Purdue University and the co-founder of a cloud startup KeyByte. He is an IEEE Computer Society Golden Core Member, Distinguished Contributor, and Distinguished Visitor.
- 2022, 1st ed. 2023, 433 Seiten, Englisch
- Herausgegeben: Long Wang, Karthik Pattabiraman, Catello Di Martino, Arjun Athreya, Saurabh Bagchi
- Verlag: Springer International Publishing
- ISBN-10: 3031020634
- ISBN-13: 9783031020636
- Erscheinungsdatum: 25.07.2022
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
- Dateiformat: PDF
- Größe: 10 MB
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