Theory and Practice of Thermal Transient Testing of Electronic Components (PDF)
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenloser tolino webreader
This book discusses the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details. It then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.
- The first book dedicated solely to thermal transient testing;
- Enables readers to accomplish thermal transient testing on any type of electronics;
- Provides valuable use cases and highlights the specialties of characterizing different devices.
Gábor Farkas, Ph.D., received his MSc in electrical engineering in 1976 and his Ph.D. in 1981 at the Budapest University of Technology and Economics, Hungary, specializing in technical physics. Since then, Dr. Farkas has worked in various fields of microelectronics, from device design to circuit testing. He was visiting scholar at several European universities. His current research focus is on testing high-power devices. He has published his research results in over 100 technical papers.
András Poppe, Ph.D., received his MSc in electrical engineering in 1986 and his Ph.D. in 1996 at the Budapest University of Technology and Economics, Hungary, where
- 2023, 1st ed. 2022, 385 Seiten, Englisch
- Herausgegeben: Marta Rencz, Gábor Farkas, András Poppe
- Verlag: Springer International Publishing
- ISBN-10: 3030861740
- ISBN-13: 9783030861742
- Erscheinungsdatum: 23.01.2023
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
- Dateiformat: PDF
- Größe: 16 MB
- Ohne Kopierschutz
- Vorlesefunktion
Schreiben Sie einen Kommentar zu "Theory and Practice of Thermal Transient Testing of Electronic Components".
Kommentar verfassen