Transmission Electron Microscopy (PDF)
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Praise for Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter:
"The best textbook for this audience available." - American Scientist
"...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!" - Microscopy and Microanalysis
"This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student." - Micron
"The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project." - MRS Bulletin
"It is truly a book so thoughtfully written that ... it will provide a solid foundation for those studying material science....an outstanding book." - IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010
David B. Williams is the Monte Ahuja Endowed Dean's Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.
- 2016, 1st ed. 2016, 518 Seiten, Englisch
- Herausgegeben: C. Barry Carter, David B. Williams
- Verlag: Springer-Verlag GmbH
- ISBN-10: 3319266519
- ISBN-13: 9783319266510
- Erscheinungsdatum: 24.08.2016
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
- Dateiformat: PDF
- Größe: 44 MB
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“Transmission Electron Microscopy, a Textbook for Materials Science, first published in 1996 with a second edition in 2009, is a comprehensive book on the subject, with a quite original approach. … The book was carefully designed for teaching purposes and its phenomenal success shows that this was time well spent.” (Peter Hawkes, Journal of Materials Science, Vol. 52, 2017)
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