VLSI Design and Test
21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
(Sprache: Englisch)
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and...
The 48 full papers presented together with 27 short papers were carefully reviewed and...
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Produktinformationen zu „VLSI Design and Test “
Klappentext zu „VLSI Design and Test “
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Inhaltsverzeichnis zu „VLSI Design and Test “
Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.
Bibliographische Angaben
- 2017, 1st ed. 2017, XXI, 815 Seiten, Maße: 15,5 x 23,5 cm, Kartoniert (TB), Englisch
- Herausgegeben: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh
- Verlag: Springer, Berlin
- ISBN-10: 9811074690
- ISBN-13: 9789811074691
- Erscheinungsdatum: 22.12.2017
Sprache:
Englisch
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