VLSI Design and Test / Communications in Computer and Information Science Bd.711 (PDF)
The 48 full papers presented together with 27 short papers were carefully reviewed and...
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
- 2017, 1st ed. 2017, 815 Seiten, Englisch
- Herausgegeben: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh
- Verlag: Springer-Verlag GmbH
- ISBN-10: 9811074704
- ISBN-13: 9789811074707
- Erscheinungsdatum: 21.12.2017
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
- Dateiformat: PDF
- Größe: 97 MB
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